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期刊名称:MACHINE VISION AND APPLICATIONS

ISSN:0932-8092
出版频率:Bimonthly
出版社:SPRINGER-VERLAG, 175 FIFTH AVE, NEW YORK, NY, 10010
  出版社网址:http://www.springerlink.com/
期刊网址:http://www.springerlink.com/app/home/journal.asp?wasp=gpt919ygrhckykqkjj1q&referrer=parent&backto=browsepublicationsresults,308,498;
影响因子:1.485(2008)
主题范畴:COMPUTER SCIENCE, CYBERNETICS;    COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE;    ENGINEERING, ELECTRICAL & ELECTRONIC

期刊简介(About the journal)    投稿须知(Instructions to Authors)    编辑部信息(Editorial Board)   



About the journal

Machine Vision and Applications

Machine Vision and Applications publishes high-quality technical contributions in machine vision research and development. Specifically, the editors encourage submittals in all applications and engineering aspects of image-related computing. In particular, original contributions dealing with scientific, commercial, industrial, military, and biomedical applications of machine vision, are all within the scope of the journal.

 Particular emphasis is placed on engineering and technology aspects of image processing and computer vision.

The following aspects of machine vision applications are of interest: algorithms, architectures, VLSI implementations, AI techniques and expert systems for machine vision, front-end sensing, multidimensional and multisensor machine vision, real-time techniques, image databases, virtual reality and visualization. Papers must include a significant experimental validation component.

 

Abstracted/Indexed in:
CompuMath Citation Index, Current Contents, Research Alert, SciSearch, Science Citation


Instructions to Authors

Manuscript submission
Manuscript Submission
Permissions
Online Submission

 


Manuscript Submission
Submission of a manuscript implies: that the work described has not been published before; that it is not under consideration for publication anywhere else; that its publication has been approved by all co-authors, if any, as well as by the responsible authorities – tacitly or explicitly – at the institute where the work has been carried out. The publisher will not be held legally responsible should there be any claims for compensation.

Permissions
Authors wishing to include figures, tables, or text passages that have already been published elsewhere are required to obtain permission from the copyright owner(s) for both the print and online format and to include evidence that such permission has been granted when submitting their papers. Any material received without such evidence will be assumed to originate from the authors.

Online Submission
Authors should submit their manuscripts online. Electronic submission substantially reduces the editorial processing and reviewing times and shortens overall publication times. Please follow the hyperlink “Submit online” on the right and upload all of your manuscript files following the instructions given on the screen.


Instructions to Authors
0932-8092.pdf

Editorial Board

 

Editor-in-Chief

Mohan M. Trivedi
Electrical and Computer Engineering Department
University of California at San Diego
La Jolla, CA 92093-0407, USA
e-mail: trivedi@ece.ucsd.edu
Fax: (619) 534-0415
Phone: (619) 822-0075

Editorial Coordinator

Patricia Campbell
10451 Caminito Alvarez
San Diego, CA 92126, USA
e-mail: p3@san.rr.com
Fax: (858) 535-3204
Phone: (858) 483-4297

Editorial Board

J. K. Aggarwal
University of Texas, Austin, TX, USA

Chris Bowman
Industrial Research Limited
Auckland, New Zealand

Kevin W. Bowyer
University of Notre Dame
Notre Dame, IN, USA

Yoram Bresler
University of Illinois at Urbana-Champaign
Urbana, IL, USA

Henrik I. Christensen
Royal Institute of Technology (KTH)
Stockholm, Sweden

Ernst D. Dickmanns
Universität der Bundeswehr
München, Germany

Masakazu Ejiri
Hitachi Ltd., Tokyo, Japan

Olivier D. Faugeras
INRIA, Antipolis, France

Leonard Ferrari
University of California
Irvine, CA, USA

Ramesh Jain
University of California, San Diego
La Jolla, CA, USA

Rangachar Kasturi
The Pennsylvania State University
University Park, PA, USA

Josef Kittler
University of Surrey, Guildford, UK

Stefano Levialdi
University of Rome, Rome, Italy

Shih-Ping Liou
Siemens Corporate Research Center
Princeton, NJ, USA

Roger Mohr
Unité de Recherche INRIA Rhône-Alpes
38330 Montbonnot Saint Martin, France

Lawrence O'Gorman
Avaya Labs
Basking Ridge, NJ, USA

André Oosterlinck
Katholieke Universiteit Leuven
Heverlee, Belgium

Dragutin Petkovic
San Francisco State University
San Francisco, CA, USA

Jeffrey Price
University of California, San Diego
La Jolla, CA, USA

A. Ravishankar Rao
IBM T.J. Watson Research Center
Yorktown Heights, NY, USA

Richard A. Robb
Mayo Clinic, Rochester, MN, USA

Ishwar K. Sethi
Wayne State University, Detroit, MI, USA

Mubarak Shah
University of Central Florida, Orlando, FL, USA

Jack Sklansky
University of California
Irvine, CA, USA

Yasuhito Suenaga
Nippon Telegraph & Telephone Corp.
Kanagawa, Japan

Daphna Weinshall
The Hebrew University of Jerusalem
Jerusalem, Israel

Jian-Kang Wu
National University of Singapore
Singapore



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